Rustenburg branch
September 2004
SAIMC
Our July meeting was well attended and a most interesting and informative lecture on gas sampling techniques was presented by Dries Griessel, an analytical product manager at ABB.
Dries Griessel (analytical product manager, ABB), Vic Cruger (Technical manager, IME) and Ria Kruger (Sales consultant, IME)
Also present from IME SA, was Ria Kruger, a sales consultant and Vic Cruger (yes, with a 'C') technical manager.
Dries ably explained that a gas analysis system was only as efficient as its sampling capability. Supplementary devices sample the sample gas from the process, condition it and feed it into the gas analysis system. In most cases, Dries pointed out, the sample gas sampled from the process cannot be processed by the gas analyser without further conditioning.
Too high a dust content, temperature and dew point as well as too high or too low pressure, and not least, interference components in the sample gas can impair the operational capability of the gas analyser and falsify the measuring result. Supplementary devices such as the sampling probe, the sample gas line, the sample gas cooler and pumps and filters ensure that the sample gas inlet conditions of the connected gas analyser is satisfied and faultless measuring results are obtained independently of the process sequence and the local conditions.
Dries and his team from Jo'burg were duly thanked for the excellent presentation and in true Rustenburg style, the evening rounded off with sumptuous snacks and refreshments supplied by the RPM-R Recreation Club.
Brian White, vice-chairman, Rustenburg Branch, [email protected]
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