June 2016Maintenance, Test & Measurement, Calibration
Tektronix has introduced the new MDO4000C oscilloscope that includes up to six built-in instruments, (spectrum analyser, arbitrary/function generator, logic analyser, protocol analyser and digital volt meter/frequency counter). The MDO4000C series, when configured with an integrated spectrum analyser, is the only instrument that provides simultaneous and synchronised acquisition of analog, digital and RF signal analysis – ideal for wireless communications in IoT and EMI troubleshooting. The MDO4000C is completely customisable and fully upgradable. Typical applications for the MDO4000C oscilloscope are:
• Embedded design: Discovers and solves issues by performing system level debug on mixed signal embedded systems including today’s most common serial bus and wireless technologies.
• Power Design: Makes reliable and repeatable voltage, current and power measurements using automated power quality, switching loss, harmonics, ripple, modulation and safe operating area measurements with the widest selection of power probes in an affordable solution.
• EMI Troubleshooting: Tracks the source of EMI in an embedded system by determining which time domain signals may be causing unwanted EMI. Observations in real-time of the effects time domain signals have on system EMI emissions.
• Wireless Troubleshooting: Whether using Bluetooth, 802.11 Wi-Fi, ZigBee, or some other wireless technology, the MDO4000C enables viewing an entire system – analog, digital and RF, time-synchronised to understand its true behaviour. Captures an ultra-wide band in a single capture to view interactions among multiple wireless technologies, or an entire broadband frequency range can be viewed from a modern standard like 802.11/ad.
• Manufacturing test and troubleshooting: Size and space constraints can play havoc on a manufacturing floor. The unique 6-in-1 MDO4000C minimises rack or bench space by integrating multiple instruments into one small package. Integration reduces cost associated with using multiple different instrument types in manufacturing test or troubleshooting stations.
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