November 2008Maintenance, Test & Measurement, Calibration
Comtest is pleased to introduce LeCroy’s new oscilloscope with complete debug solution above 1,5 GHz bandwidth. The WavePro 7Zi combines signal fidelity with an architecture that maximises speed and performance. It allows 50 and 1 M inputs for every channel and four inputs into high-speed front-end amplifiers and analog to digital converters.
Extended processing power and memory allows enhanced mathematical, statistic and graphical signal processing
The oscilloscope’s X-Stream II architecture provides 10 to 20 times faster extended memory performance. The 7Zi enables high throughput of data even when performing complex measurements. It also eliminates the trade-offs between long memory lengths and quick processing by improving CPU cache memory efficiency. Basic tasks and advanced operations can be performed two to 50 times faster and front panel response is instantaneous.
LeCroy’s new product has the ability to capture mega-samples of signal information and intuitively analyse it to find anomalies that shorten debugging time. TriggerScan uses high-speed hardware triggering capability with persistence displays to capture only the signals of interest. Traditional fast display update modes work best on frequent events occurring on slow edge rates while TriggerScan excels in finding infrequent events on fast edge rates.
Additional product features include:
* Intel Core 2 Quad processor 64-bit OS, PCI Express X4 data buses and up to 8 GB of RAM.
* Exceptional responsiveness even at maximum acquisition memory (256 Mpts).
* 500 Mpts/s data transfer to PC.
* 750 000 measurements/sec with optimal signal integrity.
* WXGA colour touch screen display.
* ProBus and ProLink probe interface on 4-6 GHz models that offer 8 inputs for multiplexing into four channels.
* Serial triggering and decode options provide a total system view.
* Mixed signal solutions with 18 and 36 digital channels.
* Bandwidth upgradeability.
A removable front panel is designed for location near the device under test; the operator can then physically probe and control the oscilloscope more effectively, increasing the efficiency of the testing process.
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