Tektronix has announced several new features and enhancements for the well known DPO7000 and the DPO and DSA70000 series high performance realtime oscilloscopes. The new capabilities provide unimpaired signal representation, as well as accurate timing and amplitude measurements resulting in enhanced productivity, reduced costs, improved efficiencies and increased customer satisfaction. The new capabilities will ease testing of high-speed serial data buses such as PCI-Express, SATA, and HDMI.
The new enhancements will assist design engineers to define, develop and test complex computing, video, communication, and data acquisition equipment. Key additions include: bandwidth limit selection to control the noise floor; faster acquisition through enhanced bandwidth to the probe tip using DSP; pattern lock triggering and event search and mark. Added to the existing capabilities of the platform, the DPO/DSA70000 series provides a highly accurate 4-channel realtime oscilloscope with fast and complete debug capability. The toolset is capable of quickly capturing elusive anomalies and transient events through triggering and analysing record length post acquisition.
Bandwidth limit selection
The oscilloscopes include as standard a series of user–selectable bandwidth limit filters that preserve the basic roll-off characteristics, flatness, and phase linearity of the instrument within the new frequency range, reducing the effects of out-of-band noise on the measurements. Design engineers can purchase one instrument for high bandwidth needs and easily optimise it to handle lowerfrequency measurements equally well by adjusting the maximum bandwidth in 1 GHz increments down to 500 MHz. The new limited bandwidth is also available at sample rates above the maximum realtime sample rate, and is selectable independently on all four channels.
Enhanced probe tip
DSP filtering has been added and complements the acquisition engine providing reliable timing and amplitude resolution and accuracy down to the probe tip for most Z-active probes (P7380, P7380SMA, P7313, P7313SMA, and P7360) and the new P7500 TriMode probes. This optimises the complete acquisition system performance for best response, enabling engineers to test up to the full bandwidth of the oscilloscope and probe combination with enhanced signal fidelity.
Pattern lock triggering
Pattern lock adds a new dimension to pattern triggering at data rates up to 6,25 Gb/s NRZ or 8b/10b with internal clock recovery by enabling the oscilloscope to take samples at specific locations in the data pattern with outstanding time base accuracy. This industry-unique feature accurately and repetitively captures an entire NRZ test pattern for in-depth analysis. Pattern lock triggering may be used to build up an eye diagram from samples taken sequentially through the data pattern. This maintains a specific timing relationship between samples and allows the oscilloscope to draw the eye based on specific bit trajectories. This feature is standard on DSA70000 Digital Serial Analyser models, and is included as part of option PTM on the DPO7000 Series and option PTH on the DPO70000 Series.
Event search and mark
This ability enables an engineer to search through a long acquisition and automatically mark all occurrences of a specified event. The user can even view the search results as an event table rather than viewing them one at a time on the waveforms themselves, providing rapid debugging of faults in complex signal structures. Event search and mark relieves the user from tedious data examination task by helping to highlight the important and facilitating the comprehension of event relationships. A basic event (edge – only) search and mark is provided standard, more advanced events support is provided with the advanced event search and mark (ASM) option for all DPO7000 and DPO70000 models. Option ASM is included standard with all DSA70000 models.
For more information contact Sue Hains, Inala Technologies, +27 (0)11 206 8307, info@inala.co.za, www.inala.co.za
© Technews Publishing (Pty) Ltd | All Rights Reserved
printer friendly version