The National Laboratory Association (NLA) is hosting the Test & Measurement 2007 Conference and Exhibition at Emperors Palace Convention Centre, Johannesburg, from 19-21 November 2007. The theme of the conference is Measurement Traceability - Challenges in the 21st century.
The key to good measurements, both physical and analytical, is the degree to which the accuracy of the measurement has been transferred from a standard of higher accuracy ultimately to one, or a combination, of the base SI units. In most physical metrology disciplines the traceability chain is well defined. However, in the field of analytical measurements this is not always the case.
This is one of the issues which will be highlighted at the conference. Also to be covered are the challenges facing well established national metrology institutes, such as the National Metrology Institute of South Africa (NMISA), compared with those facing younger national metrology institutes in SADC and Africa.
There have been a substantial number of contributions from outside of South Africa, including submissions from BIPM, NIST and prominent suppliers. The attendance of these experts will provide local members of the community an opportunity to learn from their international counterparts.
The Test & Measurement Exhibition that runs alongside the conference will provide those involved in the world of laboratories an opportunity to obtain a technology update. There are still opportunities for suppliers to exhibit and since attendance at the exhibition is independent of the conference, there is added value both for suppliers as well as those wishing only to attend the exhibition.
There is a substantial early bird discount for registering and paying by the end of September.
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